LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups
簡介
LBIC-PL-EL
- 具有最高分辨率且快速可靠的光電流映射
- 深度缺陷檢測、視覺化和識別——分流、塗層缺陷、定位非活動區域
- 研究降解效應
- 質量控制工具
- 鐳射束掃描樣品並測量激發的光電流並同時檢測光譜分辨的發光
- 電致發光測量的電激發
- 提供不同（多種）鐳射波長
- 高達 300×300 mm² 的掃描區域
- 各種太陽能技術的映射：鈣鈦礦、有機、矽、CIGS、CdTE
- 具有最高分辨率且快速可靠的光電流映射
- 深度缺陷檢測、視覺化和識別——分流、塗層缺陷、定位非活動區域
- 研究降解效應
- 質量控制工具
- 鐳射束掃描樣品並測量激發的光電流並同時檢測光譜分辨的發光
- 電致發光測量的電激發
- 提供不同（多種）鐳射波長
- 高達 300×300 mm² 的掃描區域
- 各種太陽能技術的映射：鈣鈦礦、有機、矽、CIGS、CdTE
- 不同的鐳射選擇
- 鐳射檢查光束圓度
- 多功能樣品架
- 易於使用且具有數據導出功能的控制軟體
- 用於發光測量的不同檢測器選項，針對應用和預算進行了優化
PL/EL Options
| Art. No. | Description |
|---|---|
| PL | PL Upgrade – high quality detector system optimized for each application from 200-1700 nm |
| EL | EL Upgrade (PL option required) |
| FC | Fiber bundle connector for using the detector system with other inputs |
- Fast and reliable photocurrent mapping with highest resolution
- In-depth defect detection, visualization and identification – shunts, coating defects, localize inactive regions
- Study degradation effects
- Quality control tool
- A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
- Electrical excitation for electroluminescence measurements
- Different (multiple) laser wavelengths available
- Up to 300×300 mm² scanning area
- Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
- Different laser choices
- Laser check for beam circularity
- Versatile sample holder
- Easy to use control software with data export
- Different detector options for luminescence measurements, optimized to application and budget
PL/EL Options
| Art. No. | Description |
|---|---|
| PL | PL Upgrade – high quality detector system optimized for each application from 200-1700 nm |
| EL | EL Upgrade (PL option required) |
| FC | Fiber bundle connector for using the detector system with other inputs |