產品介紹∣LBIC-PL-EL 設定
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LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups

【Automatic Research】表徵樣品測量/塗布機 表徵樣品測量設備

LBIC-PL-EL 設定

簡介

LBIC-PL-EL

  • Fast and reliable photocurrent mapping with highest resolution
  • In-depth defect detection, visualization and identification  – shunts, coating defects, localize inactive regions
  • Study degradation effects
  • Quality control tool
  • A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
  • Electrical excitation for electroluminescence measurements
  • Different (multiple) laser wavelengths available
  • Up to 300×300 mm² scanning area
  • Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,

我要諮詢
  • Fast and reliable photocurrent mapping with highest resolution
  • In-depth defect detection, visualization and identification  – shunts, coating defects, localize inactive regions
  • Study degradation effects
  • Quality control tool
  • A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
  • Electrical excitation for electroluminescence measurements
  • Different (multiple) laser wavelengths available
  • Up to 300×300 mm² scanning area
  • Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
  • Different laser choices
  • Laser check for beam circularity
  • Versatile sample holder
  • Easy to use control software with data export
  • Different detector options for luminescence measurements, optimized to application and budget

PL/EL Options

Art. No. Description
PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm
EL EL Upgrade (PL option required)
FC Fiber bundle connector for using the detector system with other inputs
  • Fast and reliable photocurrent mapping with highest resolution
  • In-depth defect detection, visualization and identification  – shunts, coating defects, localize inactive regions
  • Study degradation effects
  • Quality control tool
  • A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
  • Electrical excitation for electroluminescence measurements
  • Different (multiple) laser wavelengths available
  • Up to 300×300 mm² scanning area
  • Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
  • Different laser choices
  • Laser check for beam circularity
  • Versatile sample holder
  • Easy to use control software with data export
  • Different detector options for luminescence measurements, optimized to application and budget

PL/EL Options

Art. No. Description
PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm
EL EL Upgrade (PL option required)
FC Fiber bundle connector for using the detector system with other inputs