最新消息∣【Amptek】 新開發厚度1mm 之25mm<sup>2</sup>SDD
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技術應用 | Application Notes

2021/0119

【Amptek】 新開發厚度1mm 之25mm2SDD

1mm厚度SDD在高能量的量測能擁有更高的訊號,在60keV垂直入射下能比同等級0.5mm厚度的25mm2 SDD 高出一倍的訊號。

25keV 以上的XRF能量量測在Be窗的SDD上: 1mm厚(面積25mm2)能比0.5mm 厚(面積70mm2 )有更好的訊號!!

 

A New Industry Standard in High-Efficiency!

Amptek has developed a 1mm thick 25mm2 FAST SDD® Detector in a TO-8 package. This next-generation detector extends your XRF and EDS detector’s performance to address higher photopeak efficiency at energies above 15 keV.
Double your efficiency
For a collimated source at normal incidence, the efficiency at 60 keV is x2 higher for the 1 mm detector and varies as expected from the attenuation curves. For real XRF geometries, the solid angle factor is important, so the ratio can vary.

Features
  • 123 eV FWHM resolution at 5.9 keV
  • 25 mm² active area collimated to 17 mm²
  • Count rates > 2,000,000 CPS
  • High peak-to-background ratio – 26,000/1
  • Preamplifier Output Rise Time <60 ns
  • Windows: Be (0.5 mil) 12.5 µm, or C2 (Si3N4)
  • Radiation hard
  • Detector thickness 1000 µm
  • TO-8 Package
  • Cooling ΔT>85 K
  • Multilayer Collimator

Applications

  • Ultra-fast benchtop and handheld XRF analyzers
  • Scanning/mapping of samples in an SEM as part of an EDS system
  • On-line process control
  • X-Ray Sorting Machines
  • OEM

 

Amptel 原廠內容 https://www.amptek.com/internal-products/1mm-thick-fast-sdd