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桌上型掃描式電子顯微鏡
Benchtop SEM

【COXEM】掃描式電子顯微鏡 掃描式電子顯微鏡

桌上型掃描式電子顯微鏡

簡介

EM-30N

EM-30N 是 COXEM 面向奈米機電一體化時代持續投入技術和開發的產物,即使在高倍率下也能提供無雜訊的清晰影像,其全景功能可掃描更廣闊的區域。此外,它還與 EDS 完全相容,
從而最佳化了效能。EM-30N 的性能和價格都令人滿意,它將在所有研究領域大放異彩,為先進技術的開發和利用提供卓越的成果。

我要諮詢

EM-30N 是 COXEM 面向奈米機電一體化時代持續投入技術和開發的產物,即使在高倍率下也能提供無雜訊的清晰影像,其全景功能可掃描更廣闊的區域。此外,它還與 EDS 完全相容,
從而最佳化了效能。EM-30N 的性能和價格都令人滿意,它將在所有研究領域大放異彩,為先進技術的開發和利用提供卓越的成果。

應用

  EM-30N EM-30AXN
放大倍率 15-150,000X
空間解析度 30kV 時 < 5nm
真空模式 HV (標準)
加速電壓 1 - 30 kV(可依 1 kV比例調整)
電子源 預定心鎢絲燈芯
探測器 SED(DP), BSED(DP) SED(DP), BSED(DP), EDS
樣品尺寸 70mm (W) x 45mm (H)
X-Y/T 橫移 35x35mm / 0 - 45º
自動控制 對焦、燈絲、亮度/對比
數據輸出格式 jpg, tiff, BMP
尺寸 400 x 600 x 550 mm
重量 85 kgs
可選購 STEM
CoolStage
Panorama 2.0
30mm Active Size Compact Type EDS (Particle Analysis)
30mm Active Size Compact Type EDS (MPO included)

 

EM-30N, which is a product of COXEM ’s steady investment for technology and development with a view to the era of nano-mechatronics, can deliver clear images without noise even at high magnification and scan an even wider area with its panorama feature. Also, its full compatibility with EDS delivers optimized performance. Satisfactory both in performance and price, EM-30N will shine in all research areas and deliver superb results to the development and utilization of advanced technology.

application

  EM-30N EM-30AXN
Magnification 15-150,000X
Spatial Resolution < 5nm at 30kV
Vacuum Mode HV  (Standard)
Acceleration Voltage 1 - 30 kV(adjustable in 1kV scale)
Electron Source Pre-Centered Tungsten Filament
Detector SED(DP), BSED(DP) SED(DP), BSED(DP), EDS
Sample Size 70mm (W) x 45mm (H)
X-Y/T Traverse 35x35mm / 0 - 45º
Automation Focus, Filament, Brightness/Contrast
Data Output Format jpg, tiff, BMP
Dimensions 400 x 600 x 550 mm
Weight 85 kgs
Options STEM
CoolStage
Panorama 2.0
30mm Active Size Compact Type EDS (Particle Analysis)
30mm Active Size Compact Type EDS (MPO included)