簡介
CT-NANO
- X射線電腦斷層掃描（nanoCT）。
- 掃描電子顯微鏡(SEM)
- 數位放射線攝影（DR）
- 能量色散X射線譜（EDX）
- 3D 的立體影像CT
- 非破壞性測試（NDT）- 2D和3D
- 獨立於材料的品質控制
- 缺陷識別（空隙、裂縫...）
- 輻射安全優於1µSv/h
CT-NANO是一個全面運作的掃描電子顯微鏡，具有對輕金屬合金和纖維複合材料等試樣進行奈米級的CT量測能力。
它提供的體素尺寸範圍從30 nm到10μm，幾何放大率高達50 nm（FWHM），最大光子能量為30 kV。一個EDS探測器在樣品的XRF訊號和CT-NANO的重建體積之間提供一個額外的關聯性。
CT-NANO 在這個量測能量級別上具有市場上最佳的解析，甚至可以檢查以前不可能檢查的材料或結構。
特點
- X射線電腦斷層掃描（nanoCT）。
- 掃描電子顯微鏡(SEM)
- 數位放射線攝影（DR）
- 能量色散X射線譜（EDX）
- 3D 的立體影像CT
- 非破壞性測試（NDT）- 2D和3D
- 獨立於材料的品質控制
- 缺陷識別（空隙、裂縫...）
- 輻射安全優於1µSv/h
應用
CT- Mode
| Field Of View | Ø 49 - 3414 μm |
| Geometric Mag. | 20x - 1400x |
| Voxelsampling | 39 - 2.750 nm |
| Detector sizes | up to 60 nm |
| Reconstruction | TV-SART Phase-Contrast |
EDS – Mode
| Resolution | < MnKα 131 eV |
| Detector | cooled SSD |
| Active Area | 30 mm² |
SEM- Mode
| Resolution | < 0.7 nm |
| Probe current | max. 500 nA |
| Detector | UED + LED |
| DElectron gun | In-lens Schottky Plus field emission gun |
Digital Radiography - Mode
| Voltage max. | 30 kV |
| Current max. | 500 nA |
| Magnification | 20x - 5500x |
| No. of Pixel | max. 1280 x 1280 |
| Pixel size | 55 µm |
The CT-NANO is a fully operating scanning electron microscope with capabilities of Nano-CT measurements on specimen like light-metal-alloys and fiber composites.
It delivers Voxel-sizes in ranges from 30 nm to 10 μm, a geometrical magnification up to 50nm (FWHM) and a maximum photon energy of 30 keV. An EDS-Detector provides an additional correlation between XRF signal of specimen and reconstructed volume of the CT-NANO.
CT-NANO has the best resolution avaible at the market at this energy level, which allowes to inspect materials or sructures which were not even possible before.
Features
- X ray Computed Tomography (nanoCT)
- Scanning Electron Microscope (SEM)
- Digital Radiography (DR)
- Energy-Dispersive X ray spectroscopy (EDX)
- 3D volume CT
- Non-destructive testing (NDT) – 2D and 3D
- Quality control independent of material
- Defect recognition (voids, cracks, …)
- Radiation safety better than 1 µSv
Application Examples
CT- Mode
| Field Of View | Ø 49 - 3414 μm |
| Geometric Mag. | 20x - 1400x |
| Voxelsampling | 39 - 2.750 nm |
| Detector sizes | up to 60 nm |
| Reconstruction | TV-SART Phase-Contrast |
EDS – Mode
| Resolution | < MnKα 131 eV |
| Detector | cooled SSD |
| Active Area | 30 mm² |
SEM- Mode
| Resolution | < 0.7 nm |
| Probe current | max. 500 nA |
| Detector | UED + LED |
| DElectron gun | In-lens Schottky Plus field emission gun |
Digital Radiography - Mode
| Voltage max. | 30 kV |
| Current max. | 500 nA |
| Magnification | 20x - 5500x |
| No. of Pixel | max. 1280 x 1280 |
| Pixel size | 55 µm |