簡介
ModuLab® XM Series|ModuLab® PhotoEchem
恆電位儀 |
|
插槽 |
1個 |
電池連接 |
2、3或4端 |
儀器連接 |
CE、WE、RE、lo |
浮接測量 |
有 |
阻抗測量頻寬 |
1MHz (透過頻率響應分析儀) |
最大的ADC取樣率 |
1MS/s |
平滑掃描產生器 |
64MS/s內插及濾波 |
最大的時間記錄 |
1MS/s |
DC掃描速率(恆電位) |
1.6MV/s ~ 1µV/s |
DC掃描速率(恆電流) |
60kA/s ~ 200µA |
最小的脈衝持續時間 |
1µs |
IR補償 |
有 |
對電極 |
|
電壓極化範圍 |
±8V (±100V) |
電流極化範圍 |
±300mA (±2 A) |
參考輸入(RE) |
|
連接 |
差動輸入 |
導線遮蔽 |
驅動/接地 |
最大的電壓測量 |
±8V |
工作電極(WE) |
|
最大電流 |
±300mA |
範圍 |
300mA ~ 30nA |
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
Key Features:
Not just for DSSC's...
The system can equally be used for the following applications:
Potentiostat |
|
Slots Taken |
1 |
Cell Connections |
2,3,or 4 terminal |
Instrument Connections |
CE, WE, RE, lo |
Floating Measurements |
yes |
Impedance Measurement Bandwidth |
1 MHz (via FRA) |
Maximum ADC sample rate |
1MS/s |
Smooth S an Gene ator |
64 MS/s interpolated and filtered |
Maximum Time Record |
1 MS/s |
DC Scan Rate (potentiostatic) |
1.6 MV/s to 1 µV/s |
DC Scan Rate (galvanostatic) |
60 kA/s to 200 µAs |
Minimum Pulse Duration |
1µs |
iR Compensation |
yes |
Counter Electrodes |
|
Voltage Polarization Range |
±8 V (±100V) |
Current Polarization Range |
±300 mA (± 2A) |
Reference Inputs (RE) |
|
Connections |
Differential Input |
Cable Shields |
Driven / Ground |
Maximum Voltage Measurements |
±8V |
Working Electrode (WE) |
|
Maximum Current |
±300 mA |
Ranges |
300 mA to 30nA |