簡介
SDD-25mm2
- 工作面積/厚度：25mm2/ 500um
- 解析度：125 eV
- 計數率：200k cps
- 訊號-背景比：20,000:1
- 窗口： Be
- X光螢光訊號 （XRF）
- RoHS/WEEE 檢測
- 貴金屬、合金、輕元素分析
- EDS
- Mössbauer Spectrometers
- 粒子誘發的X射線（PIXE）
- 波長色散XRF
- 工作面積/厚度：25mm2/ 500um
- 解析度：125 eV
- 計數率：200k cps
- 訊號-背景比：20,000:1
- 窗口： Be
- X光螢光訊號 （XRF）
- RoHS/WEEE 檢測
- 貴金屬、合金、輕元素分析
- EDS
- Mössbauer Spectrometers
- 粒子誘發的X射線（PIXE）
- 波長色散XRF
|
探測器種類 |
Silicon Drift Detector (SDD) |
|
探測器面積 |
25 mm2 – collimated to 17 mm2 |
|
Silicon厚度 |
500 µm |
|
準直器 |
Internal Multilayer |
|
能量解析度@ 5.9 keV (55Fe) |
125 – 135 eV FWHM at 11.2 µs peaking time |
|
訊號-背景比 |
20,000:1 (ratio of counts from 5.9 keV to 1 keV) (typical) |
|
探測器窗口種類 |
Beryllium (Be): 0.5 mil (12.5 µm) or 0.3 mil (8 µm) |
|
電荷感應前置放大器 |
Amptek custom reset preamplifier. |
|
增益穩定 |
<20 ppm/°C (typical) |
|
尺寸 |
3.00 x 1.75 x 1.13 in (7.6 x 4.4 x 2.9 cm) |
|
重量 |
4.4 ounces (125 g) |
|
功率 |
<2 Watt |
- 125 eV FWHM Resolution @ 5.9 keV
- High Peak-to-Background Ratio – 20,000:1
- 25 mm2 – collimated to 17 mm2
- 500 µm Thick
- 2-Stage Thermoelectric Cooler
- Cooling ΔT>85 K
- Temperature Monitor
- Thin Beryllium 0.3 or 0.5 mil
Patented C-Series windows available with FAST SDD - Multilayer Collimator
- Hermetic Package (TO-8)
- Wide Detection Range
- Easy to Operate
- Radiation Hard
| Detector Type | Silicon Drift Detector (SDD) |
| Detector Area | 25 mm2 – collimated to 17 mm2 |
| Silicon Thickness | 500 µm |
| Collimator | Internal Multilayer |
| Energy Resolution @ 5.9 keV (55Fe) | 125 – 135 eV FWHM at 11.2 µs peaking time |
| Peak to Background | 20,000:1 (ratio of counts from 5.9 keV to 1 keV) (typical) |
| Detector Window Options | Beryllium (Be): 0.5 mil (12.5 µm) or 0.3 mil (8 µm) Patented C-Series:C1 and C2 low energy windows available with FastSDD |
| Charge Sensitive Preamplifier | Amptek custom reset preamplifier. |
| Gain Stability | <20 ppm/°C (typical) |
| XR-100SDD Case Size | 3.00 x 1.75 x 1.13 in (7.6 x 4.4 x 2.9 cm) |
| XR-100SDD Weight | 4.4 ounces (125 g) |
| Total Power | <2 Watt |